Hawkes International Semiconductor's E-Test Ordering Page

Thank you very much for visiting this page. If you have received a quote from us for device test and characterization service, please place an order now by clicking "Add to Cart" button below. A Shopping Cart will display where you can set "QTY." to your quoted price and complete the rest of the order form. Finally, please do not forget to input your quote number in "Comments" field.

E-Test UnitOur low-leakage I-V and C-V probing capabilities are
  • Minimum voltage source and measure resolution: 100 nV
  • Minimum current source and measure resolution: 10 fA
  • C-V frequency: 20 Hz ~ 2 MHz. DC bias: 0~40 V.
  • Chuck temperature range: 25 to 200 degree C.
  • Whole or partial wafer (up to 12" dia.) probing.
  • Learn more about our Device Lab by clicking here.


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